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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 6579-6584 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This work shows that the electric field enhancement of the plate edges in all-film capacitors has only a very small effect on the current value through the capacitor although this enhancement could lead to dielectric breakdown at low frequency for high voltage. On the other hand, the electric field along the plates depends on frequency and on the resistivity of the plates. Consequently, the surface admittance Ys of the capacitor will also vary with frequency. This latter parameter has been described by an equivalent circuit with lumped elements. Thanks to this equivalent circuit and to previous work, it will be possible to determine with good accuracy the current distribution in metallized capacitors. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5288-5293 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We attempt to establish the mathematical expression of the current and the magnetic field in a metallized capacitor. The expression of the impedance of this capacitor is also presented. The distribution of the current is discussed through the variation of the capacitor impedance and compared to experimental ones. There is good agreement between experimental and theoretical results. The analytical expressions of the magnetic field and the current also show a dependence on parameter δ2 akin to the skin depth in conductors. δ2 also depends on frequency. When δ2 is smaller than the outer radius of the capacitor, the current distribution becomes inhomogeneous.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
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