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  • 1
    Online Resource
    Online Resource
    Dordrecht :Springer Netherlands,
    Keywords: Turbulence-Congresses. ; Electronic books.
    Type of Medium: Online Resource
    Pages: 1 online resource (394 pages)
    Edition: 1st ed.
    ISBN: 9789401110327
    Series Statement: ICASE LaRC Interdisciplinary Series in Science and Engineering Series ; v.2&3
    Language: English
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 4500-4505 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A far ultraviolet (UV) spectroscopic ellipsometer system working up to 9 eV has been developed, and applied to characterize high-K-dielectric materials. These materials have been gaining greater attention as possible substitutes for SiO2 as gate dielectrics in aggressively scaled silicon devices. The optical properties of four representative high-K bulk crystalline dielectrics, LaAlO3, Y2O3-stabilized HfO2 (Y2O3)0.15–(HfO2)0.85, GdScO3, and SmScO3, were investigated with far UV spectroscopic ellipsometry and visible-near UV optical transmission measurements. Optical dielectric functions and optical band gap energies for these materials are obtained from these studies. The spectroscopic data have been interpreted in terms of a universal electronic structure energy scheme developed form ab initio quantum chemical calculations. The spectroscopic data and results provide information that is needed to select viable alternative dielectric candidate materials with adequate band gaps, and conduction and valence band offset energies for this application, and additionally to provide an optical metrology for gate dielectric films on silicon substrates. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Accounts of chemical research 7 (1974), S. 106-113 
    ISSN: 1520-4898
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 162-164 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a far UV spectroscopic ellipsometer system working up to 9 eV, and applied it to the characterization of three 4H-SiC samples with different surface conditions [i.e., as-received and chemical mechanical processing (CMP) processed 4H-SiC bulk substrates and a 4H-SiC epi sample]. Pseudodielectric functions cursive-epsilon1 and cursive-epsilon2 clearly demonstrate the excellent surface sensitivity of the far UV ellipsometry system as it distinguishes the improvements provided by CMP process. Simulation results of ellipsometer data indicate the existence of a damaged subsurface layer in the as-received 4H-SiC bulk substrate. The investigation of sample surfaces using atomic force microscopy confirms the results of ellipsometry measurements. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 1399-1401 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This letter describes an electric-field assisted assembly technique used to position individual nanowires suspended in a dielectric medium between two electrodes defined lithographically on a SiO2 substrate. During the assembly process, the forces that induce alignment are a result of nanowire polarization in the applied alternating electric field. This alignment approach has facilitated rapid electrical characterization of 350- and 70-nm-diameter Au nanowires, which had room-temperature resistivities of approximately 2.9 and 4.5×10−6 Ω cm. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1692-1694 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simplified device structure for depletion-mode organic thin film transistors is described in which the gate electrode and the source/drain contacts are prepared in the same process step, thus reducing the number of material depositions and photolithography steps. Based on the simplified device structure and using the small-molecule aromatic hydrocarbon pentacene as the active material, organic thin film transistors were fabricated on glass substrates with carrier mobility of 0.6 cm2/V s, on/off current ratio of 105, and subthreshold slope of 0.5 V/decade. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Journal of the American Water Resources Association 15 (1979), S. 0 
    ISSN: 1752-1688
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Architecture, Civil Engineering, Surveying , Geography
    Notes: : Remote sensing offers an attractive alternative to conventional data collection employed in the estimation of certain hydrologic model parameters. In this investigation, the standard error of parameters estimated from Landsat data are examined. Relationships between the standard error and the size of the spatial-modeling units are developed that allow extending results to larger areas. Based upon the investigations conducted, a generalized model of the error relationships could not be developed.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Journal of the American Water Resources Association 17 (1981), S. 0 
    ISSN: 1752-1688
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Architecture, Civil Engineering, Surveying , Geography
    Notes: Estimating the Curve Numbers used in the Soil Conservation Service hydrologic models is a tedious and costly task. Recent advances in remote sensing and data processing have led to the development of readily available land cover data bases for many areas of the United States. This study evaluated the potential of using a Landsat data base to make the Curve Number estimation process more cost-effective and less tedious. Ten watersheds in the Washington, D.C., area were evaluated using a Landsat land cover data base developed by the U.S. Geological Survey. Results showed that these data can be useful. Predictions can be improved if ancillary data on residential lot size are included. It was concluded that this type of data base must be examined carefully before implementation.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Journal of the American Water Resources Association 18 (1982), S. 0 
    ISSN: 1752-1688
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Architecture, Civil Engineering, Surveying , Geography
    Notes: : The Soil Conservation Service (SCS) models, including the TR-20 computer program and the simplified methods in TR-55, are widely used in hydrologic design. The runoff curve number (CN), which is an important input parameter to SCS models, is defined in terms of land use tretments, hydrologic, condition, antecedent soil moisture, and soil type. The objective of this study was to evaluate the sensitivity of the SCS models to errors in CN estimates. The results show that the effects of CN variation decrease as the design rainfall depth increases, such as for the larger storm events. The value and use of the sensitivity curves are demonstrated using a comparison of Landsat and conventionally derived curve numbers for three watersheds in Pennsylvania.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    The @journal of child psychology and psychiatry 18 (1977), S. 0 
    ISSN: 1469-7610
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine , Psychology
    Notes: This study focused on the degree to which resting levels of autonomic “arousal” were related to hyperkinetic behaviors and stimulant drug responses. A total of 24 boys served as subjects, 12 of whom were hyperkinetic and had a history of responding well to methylphenidate while 12 normal boys served as a matched control group. The control boys were evaluated once while the hyperkinetic boys were seen on three occasions during which they participated in a double-blind, placebo-controlled crossover study of methylphenidate. All children were evaluated using five psycho-physiological measures of autonomic nervous system activity and 11 objective measures of activity level and attention taken across four experimental settings. Results indicated no significant differences between hyperkinetic and normal boys in psychophysiological activity. In addition, no consistent relationships between this activity and the objective behavioral measures in either normal or hyperkinetic boys were observed. Improvements in activity level and attention during drug treatment were generally not related to the pretreatment levels of arousal in the hyperkinetic boys. Methylphenidate did not produce any significant effects on autonomic activity. Thus, results suggested that no simple level of arousal hypothesis can account for the behavior patterns of hyperkinetic children and that level of arousal is not a particularly useful predictor of drug responding in these children.
    Type of Medium: Electronic Resource
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