GLORIA

GEOMAR Library Ocean Research Information Access

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Online Resource
    Online Resource
    San Diego :Elsevier Science & Technology,
    Keywords: Chemistry, Analytic -- Qualitative. ; Spot tests (Chemistry). ; Chemistry, Organic. ; Electronic books.
    Type of Medium: Online Resource
    Pages: 1 online resource (797 pages)
    Edition: 7th ed.
    ISBN: 9780444597977
    Language: English
    Note: Front Cover -- Spot Tests in Organic Analysis -- Copyright Page -- Table of Contents -- Foreword -- Chapter 1. Developmenty Present State and Prospects of Organic Spot Test Analysis -- Chapter 2. Preliminary (Exploratory) Tests -- General remarks -- 1. Non-chemical proofs -- 2. Burning and pyrolysis tests -- 3. Examination of ignition residues -- 4. Carbon -- 5. Hydrogen -- 6. Halogens -- 7. Chlorine -- 8. Bromine -- 9. Iodine -- 10. Fluorine -- 11. Oxygen -- 12. Sulfur -- 13. Compounds with groups containing sulfur and oxygen -- 14. Selenium -- 15. Nitrogen -- 16. Compounds with groups containing nitrogen and oxygen -- 17. Sulfur and nitrogen (joint detection) -- 18. Phosphorus -- 19. Arsenic -- 20. Antimony -- 21. Silicon -- 22. Mercury -- 23. Metals -- 24. Tests for basic or acidic behavior -- 25. Detection of occult acidic groups -- 26. Detection of occult (non-basic) amino groups -- 27. Detection of water-soluble salts of organic bases and alkali salts of organic acids -- 28. Detection of water-soluble salts of sulfonic and sulfinic acids -- 29. Detection of water-insoluble bases and acids -- 30. Detection of compounds which react with acids -- 31. Orientation tests based on redox reactions -- 32. The Le Rosen test for aromatic compounds -- 33. Sulfonation test for aromatics -- 34. Pyrolysis tests for aromatic compound constaining oxygen -- 35. Ehrlich diazo test for compounds capable of coupling -- 36. Golmant chloranil test -- 37. Fuming-off test with concentrated nitric acid -- 38. Fusion test with benzoin -- 39. Sinter test with mercuric cyanide -- 40. Detection of compounds which split off water or ammonia when heated to 190° -- 41. Detection of compounds which yield ammonia when pyrolyzed -- 42. Detection of compounds which yield ammonia when heated with caustic alkali and Devarda alloy. , 43. Detection of compounds which split off water when heated to 180 -- 44. Compounds containing reactive CH2 and -NH2 groups -- 45. Solubility tests -- Chapter 3. Detection of Characteristic Functional Groups in Organic Compounds -- General remarks -- A. Groups containing carbon and hydrogen -- B. Organic halogen compounds -- C. Oxygen compounds (organic derivatives of water) -- D. Sulfur and selenium compounds -- E. Nitrogen compounds -- F. Organic compounds of P, As, Sb, Bi, and Hg -- Chapter 4. Detection of Structures and Certain Types of Organic Compounds -- General remarks -- 1. Vicinal polyalcohols ( C(OH)-(HO)C type) -- 2. 7-Dehydrosterols -- 3. Phenoxy compounds ( C6H5O-type ) -- 4. Polyhydroxybenzenes (C6H6-n(OH)n type) -- 5. m-Dihydroxybenzene derivatives -- 6. m-Dihydroxyaryl compounds (m-Ar(OH)2 type) -- 7. vic-Trihydroxyaryls -- 8. p-Hydroxy» and p-alkoxy-benzene derivatives -- 9. Methylene ethers of o-diphenols -- 10. 1,2-Dioxo compounds (-CO-CO- type) -- 11. Aliphatic 1,2-dioxo compounds (R-CO-CO-R type) -- 12. Aromatic 1,2-dioxo compounds and o-quinones (Ar-GO-CO-Ar type) -- 13. 1,2-Dioxo compounds and quinones -- 14. Quinones -- 15. o-Quinones -- 16. Naphthoquinones -- 17. p-Naphthoquinones -- 18. Anthraquinones -- 19. Carbohydrates -- 20. Reducing sugars -- 21. Hexoses -- 22. Ketohexoses -- 23. o-Hydroxyaryl carbonyl compounds -- 24. o-Hydroxyarylaldehydes -- 25. p-Hydroxyarylaldehydes -- 26. p-Hydroxy- and p-alkoxyaldehydes -- 27. Arylvinyl- and p-hydroxy-(alkoxy-)aryl-aldehydes -- 28. Polyhydroxyanthraquinones -- 29. Acyloins (Ar-CHOH-CO-Ar type) -- 30. 5-Hydroxyflavonols -- 31. 1,2-Dicarboxylic acids -- 32. α-Halogenofatty acids (-CHHalCOOH type) -- 33. Uronic acids -- 34. Salicylic acid derivatives -- 35. Phenoxyacetic acids -- 36. Phenol- and α-naphthol-sulfonic acids -- 37. Naphthalenesulfonic acids. , 38. Anthraquinonesulfonic acids -- 39. N-Alkylanilines -- 40. Ν,Ν-Dialkylanilines -- 41. Diphenylamine and derivatives -- 42. Halogenated anilines -- 43. β-Hydroxyethylamines -- 44. Amino acids -- 45. Aliphatic aminocarboxylic and -sulfonic acids -- 46. Aliphatic aminocarboxylic acids -- 47. α-Aminocarboxylic acids -- 48. Proteins -- 49. Aniline- and phenolsulfonic acids -- 50. Aniline derivatives containing strongly acidic groups in the para-position -- 51. Anilinearsonic and anilinestibonic acids -- 52. o- and peri-Hydroxyarylamines -- 53. Aromatic tertiary N-ring bases -- 54. Aromatic heterocyclic ring bases -- 55. Pyrrole derivatives -- 56. Indole derivatives -- 57. Carbazole derivatives -- 58. Pyridine derivatives -- 59. Pyridine-aldehydes -- 60. α-Carboxylic acids of aromatic heterocyclic bases -- 61. 8-Hydroxyquinoline and derivatives -- 62. Urea and derivatives -- 63. Thiourea and derivatives -- 64. Quinonechloroimines -- 65. Aliphatic 1,2-dioximes -- 66. o-Nitrosophenols -- 67. p-Nitrosophenols -- 68. o-Nitrosonaphthol derivatives -- 69. p-Nitrosoarylamines -- 70. m-Dinitro compounds -- 71. Benzaldehydesulfonic acids -- 72. Aminophenols -- 73. Phenylhydrazinesulfonic acids -- 74. Nitro- and aminobenzaldehydes -- Chapter 5. Identification of Individual Organic Compounds -- General remarks -- 1. Acetylene -- 2. Naphthalene -- 3. Anthracene and phenanthrene -- 4. Anthracene -- 5. Phenanthrene -- 6. Chloroform and bromoform -- 7. Bromoform -- 8. Carbon tetrachloride -- 9. Methanol -- 10. Ethanol -- 11. Cyclohexanol and cyclohexanone -- 12. Glycerol -- 13. Inositol -- 14. p-Cresol -- 15. α-Naphthol -- 16. β-Naphthol -- 17. Pyrocatechol -- 18. Resorcinol -- 19. Orcinol -- 20. Naphthoresorcinol -- 21. Hydroquinone -- 22. Pyrogallol -- 23. Hydroxyhydroquinone -- 24. Phloroglucinol -- 25. Pentachlorophenol -- 26. Salicyl alcohol (saligenin). , 27. Carbon monoxide -- 28. Formaldehyde -- 29. Acetaldehyde -- 30. Chloral and bromal -- 31. Citral -- 32. Glyoxal -- 33. o-Phthalaldehyde -- 34. Furfural -- 35. Acetone -- 36. Diacetyl -- 37. Acetylacetone -- 38. p-Benzoquinone -- 39. Chloranil -- 40. Phenanthraquinone -- 41. Rhodizonic acid -- 42. Formic acid -- 43. Acetic acid -- 44. Cinnamic acid -- 45. Oxalic acid -- 46. Esters of oxalic acid -- 47. Malonic acid -- 48. Succinic acid -- 49. Monochloroacetic acid -- 50. Dichloroacetic acid -- 51. Trichloroacetic acid -- 52. Glycolic acid -- 53. Lactic acid -- 54. Glyceric acid -- 55. Malic acid -- 56. Tartaric acid -- 57. Mucic acid -- 58. Citric acid -- 59. Ascorbic acid (vitamin C) -- 60. Salicylic acid -- 61. Phenoxyacetic acid -- 62. Coumarin -- 63. Glyoxalic (glyoxylic) acid -- 64. Pyruvic acid -- 65. Acetoacetic ester -- 66. Phosgene -- 67. Benzoyl peroxide -- 68. Carbon disulfide -- 69. Thio-Michler's ketone -- 70. Thiophene -- 71. Dixanthogen -- 72. Benzenesulfonic acid -- 73. α-Naphthalenesulfonic acid -- 74. Sulfosalicylic acid -- 75. 1,2-Naphthoquinone-4-sulfonic acid -- 76. Phenylsulfuric acid -- 77. Ethylenediamine and propylenediamine -- 78. Hexamethylenetetramine (urotropine, hexamine) -- 79. Aminoacetic acid (glycine) -- 80. α-Aminopropionic acid (α-alanine) -- 81. Hippuric acid -- 82. Tyrosine -- 83. Tryptophan -- 84. Ethylenediaminetetraacetic acid -- 85. Taurine (2-aminoethanesulfonic acid) -- 86. Benzylamine -- 87. α-Naphthylamine -- 88. o-Phenylenediamine -- 89. p-Phenylenediamine -- 90. p-Aminodimethylaniline -- 91. Tetrabase (4,4'-tetramethyldiaminodiphenylmethane) -- 92. Benzidine sulfate -- 93. o-Aminophenol -- 94. m-Aminophenol -- 95. p-Aminophenol -- 96. Ν,Ν-Diphenylanthranilic acid -- 97. Piperidine -- 98. Piperazine -- 99. Carbazole -- 100. Thiodiphenylamine (phenothiazine) -- 101. Pyridine -- 102. Pyridine-2-aldehyde. , 103. 3-Pyridinesulfonic acid -- 104. Quinoline -- 105. Isoquinoline -- 106. 8-Hydroxyquinoline -- 107. 8-Hydroxyquinolinesulfonic acids -- 108. Urea -- 109. Guanidine -- 110. Biguanide -- 111. Melamine -- 112. Formamide -- 113. N,N-Dimethylformamide -- 114. Formanilide -- 115. Benzamide -- 116. Oxamide -- 117. Oxanilide and oxanilic acid -- 118. Succinimide -- 119. N-Bromo(chloro-)succinimide -- 120. Isatin -- 121. Barbituric acid -- 122. Barbituric and thiobarbituric acid -- 123. Alloxan -- 124. Parabanic acid (oxalylurea) -- 125. Hydantoin and allantoin -- 126. Hydrocyanic acid (Prussic acid) -- 127. Dicyanogen -- 128. Cyanogen halides -- 129. Cyanoacetic acid -- 130. Cyanamide -- 131. Dicyanodiamide (cyanoguanidine) -- 132. Benzonitrile (phenyl cyanide) -- 133. Phenylhydrazine -- 134. Hydrazobenzene -- 135. Oxalic acid hydrazides -- 136. p-Nitrosophenol -- 137. α-Nitroso-β-naphthol -- 138. p-Nitrosodimethyl(ethyl)aniline -- 139. Nitromethane -- 140. Nltroethane -- 141. m-Nitrophenol -- 142. p-Nitrobenzaldehyde -- 143. rn-Nitroaniline -- 144. p-Nitroaniline -- 145. Thiocyano-2,4-dinitrobenzene -- 146. Phenylisothiocyanate (phenyl mustard oil) -- 147. N-Phenylsulfamic acid -- 148. Triphenyl phosphate -- Chapter 6. Application of Spot Tests in the Differentiation of Isomers and Homologous Compounds. Determination of Constitutions -- General remarks -- 1. Anthracene and phenanthrene -- 2. Phthalic-terephthalic acid. Maleic-fumaric acid -- 3. Naphthols, aminophenols and nitroanilines -- 4. Thiocyanates and isothiocyanates -- 5. Eugenol-isoeugenol. Safrole-isosafrole -- 6. Vanillins -- 7. Differentiation of dihydroxybenzenes -- 8. ω-Bromoacetophenone and p-bromoacetophenone -- 9. Naphthoquinones -- 10. Isomeric monohalogenofatty acids -- 11. Phenylsulfuric acid and phenolsulfonic acid -- 12. Naphthylamines -- 13. α- and β-Naphthylaminesulfonic acids. , 14. Benzylamine, monomethylaniline and (ο-, m-, p-)toluidine.
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 2
    Online Resource
    Online Resource
    Oxford : Elsevier Science
    Keywords: Electronic books
    Description / Table of Contents: Many years have passed since the last edition of the present book was published. The discovery during this period of many new reagents has resulted in a vast accumulation of data on their application and made this completely revised edition necessary. Numerous new tests and various new chapters have been added. Chapters 3,4 and 5 of the fifth edition have been combined into one chapter, which is divided into sections devoted to the elements. These sections are arranged in alphabetical order to make for easier location of information on a given element. To further improve the usefuln
    Type of Medium: Online Resource
    Pages: Online-Ressource (700 p)
    Edition: 6th ed
    ISBN: 9780444409294
    DDC: 544.834
    Language: English
    Note: Description based upon print version of record , Front Cover; Spot Tests in Inorganic Analysis; Copyright Page; Foreword; Table of Contents; CHAPTER 1. DEVELOPMENT, PRESENT STATE AND PROSPECTS OF INORGANIC SPOT TEST ANALYSIS; References; CHAPTER 2. METHODOLOGY OF SPOT TEST ANALYSIS; 1. Introduction; 2. Laboratory; 3. Sampling; 4. Fundamental treatment; 5. Separation techniques; 6. Handling of vapors and separation of gases; 7. Conduct of spot test analysis; 8. Special methods and procedures; References; CHAPTER 3. PRELIMINARY ORIENTATIONAL TESTS , 1. Behavior of solids when heated on magnesia (spoon) or in contact with porcelain (dish or micro crucible)2. Behavior of solids when heated in an ignition tube; 3. Tests for H+ and OH- ions without use of acid-base indicators; 4. Tests for soluble and insoluble basic materials; 5. Tests for oxidants in acidic medium; 6. Test for oxidizing anions in alkaline medium; 7. Test for reductants in acidic medium; 8. Tests for reductants in alkaline medium; 9. Tests for halogen ions and silver halides; 10. Test for sulfur-bearing materials; 11. Test for anions containing sulfur , 12. Test for metal ions that form insoluble sulfides13. Test for acidic sulfides; 14. Test for compounds that contain divalent sulfur; 15. Test for ions and compounds that remove sulfide ions; 16. Test for elemental selenium, tellurium, arsenic, antimony and tin; 17. Test for arsenicIII, antimonymIII and tinII in alkaline solution; 18. Test based on reduction to the elemental state by iron(II) sulfate; 19. Test for higher metal oxides; 20. Tests for metals that are attacked by dilute acids; 21. Tests for metals that are attacked by caustic alkali , 22. Selective precipitation of palladium, silver and lead as selenosulfate23. Test for oxides of molybdenum, tungsten and vanadium; 24. Test for elementary sulfur, selenium and tellurium; 25. Test for platinum metals; CHAPTER 4. TESTS FOR THE ELEMENTS, THEIR IONS AND COMPOUNDS; Aluminum; Antimony; Arsenic; Barium; Beryllium; Bismuth; Boron; Bromine; Cadmium; Calcium; Carbon; Cerium; Cesium; Chlorine; Chromium; Cobalt; Copper; Fluorine; Gallium; Germanium; Gold; Hafnium; Hydrogen; Indium; Iodine; Iridium; Iron; Lanthanum; Lead; Lithium; Magnesium; Manganese; Mercury; Molybdenum; Nickel , NiobiumNitrogen; Osmium; Oxygen; Palladium; Phosphorus; Platinum; Plutonium; Potassium; Rare earths; Rhenium; Rhodium; Rubidium; Ruthenium; Scandium; Selenium; Silicon; Silver; Sodium; Strontium; Sulfur; Tantalum; Technetium; Tellurium; Thallium; Thorium; Tin; Titanium; Tungsten; Uranium; Vanadium; Yttrium; Zinc; Zirconium; CHAPTER 5. APPLICATION OF SPOT REACTIONS IN TESTS OF PURITY, EXAMINATION OF TECHNICAL MATERIALS, STUDIES OF MINERALS; 1. Detection of alkali metals in silicates; 2. Detection of alkali earth and alkali in ash of paper, charcoal, and coal , 3. Detection of traces of aluminum in water
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 2512-2521 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This work examines the electrical behavior of metal-oxide-semiconductor capacitors in which positive charge has been generated in the silicon dioxide layer using either avalanche hole injection, avalanche electron injection, or Fowler-Nordheim Tunneling injection. It is concluded on the basis of flatband voltage measurements made as a function of time following charge injection that two distinct species of positive charge are generated in the oxide layer, depending on the nature of charge generation. In particular, avalanche hole injection results in the generation of trapped holes, while avalanche electron injection and Fowler-Nordheim Tunneling result in so-called "slow-states'' or anomalous positive charge centers. The electrical behavior of these two species is discussed. In addition, interface trap density measurements following avalanche hole injection show that both a background level of interface traps and a peak at approximately 0.8 eV above the valence band edge build with time following injection. Further, the dependence of the interface trap density on injection fluence and time supports a model in which a neutral species is released from the bulk of the oxide during hole injection and subsequently generates an interface defect.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 4
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 77 (1955), S. 4162-4163 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 73 (1951), S. 5630-5631 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 6
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 73 (1951), S. 5631-5635 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2118-2120 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An electron trapping instability in silicon dioxide films sputtered onto silicon substrates was analyzed by metal-oxide-semiconductor electrical methods and electron paramagnetic resonance (EPR), and was compared with an E' defect model from molecular orbital cluster calculations. This comparison indicates that an E' defect may well be responsible for the observed trapping instability, since electrically measured trap filling and emptying was quantitatively correlated with a reversible variation in the EPR signal magnitude. The specific model proposed for this defect is a "surface-like'' or hemi-E' center, O3≡Si−, which upon loss of an electron becomes O3≡Si+ and relaxes towards a planar configuration. The relaxation energy associated with the restoration of the original configuration is manifested as a hysteresis in the electrical trap filling and emptying cycle.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 1913-1919 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The behavior of the controlling feedback voltage during constant current avalanche hole injection experiments on metal-oxide-semiconductor capacitors has been analyzed in detail. It is concluded that at dc hole current densities greater than 50 nA/cm2, displacement currents generated in the oxide as a result of a change in the feedback voltage can dominate the injected hole current. The effect of this displacement current on the determination of hole trapping kinetics is evaluated quantitatively. In particular, it is shown that the effect of the displacement current is to reduce the hole current density and cause an apparent delay in oxide charging kinetics. In addition, it is shown that the feedback voltage necessary to maintain current densities larger than 50 nA/cm2 induces a measurable electron current from the gate electrode when the oxide field exceeds 6 MV/cm. Analysis of this phenomenon provides evidence for hole trapping at the Al-SiO2 interface as well as an estimate of the capture cross section for this process. The estimated cross section,1×10−14 cm2, is similar in magnitude to that obtained for hole trapping at the Si-SiO2 interface. It is concluded that while displacement currents and gate electron injection may affect the determination of hole trapping kinetics, these effects can be avoided at current densities below 50 nA/cm2. Finally, consideration of the relative changes in the feedback and flat-band voltage data during low-current density experiments suggests that the feedback voltage does not respond to charge in interface traps.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2221-2223 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have studied electron trapping and detrapping resulting from bias stress applied to a metal-sputtered oxide-native oxide-semiconductor capacitor. The trapping process is described as band-to-trap tunneling. Based on the assumption of a trap with a delta function spatial distribution, a model was developed that predicts a trap energy distribution and defect relaxation energy. Application of this model to experimental data reveals a value for the relaxation energy of approximately 1 eV. We suggest that this model may apply to hysteretic instabilities observed in p-channel transistors and dual dielectric memory devices.
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
  • 10
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Industrial and engineering chemistry 8 (1936), S. 401-410 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    Location Call Number Limitation Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...