In:
Review of Scientific Instruments, AIP Publishing, Vol. 78, No. 2 ( 2007-02-01)
Abstract:
Time scales of long-range physical processes in solids are typically in the range of picoseconds to nanoseconds. These times are commensurate with the time resolution of structural probes based on modern synchrotron x-ray sources. Several processes of technological and scientific interest can be driven by applied electric fields, but synchronizing electrically driven phenomena with an x-ray probe poses a technical challenge. We describe the synchronization of a well-defined number of fast electrical pulses with the time structure of synchrotron x rays to probe the dynamics of thin films and nanostructures. This synchronization technique yields x-ray transient signals with 600ps transitions in ferroelectric thin films, with a contribution of approximately 320ps due to timing jitter in the synchronization.
Type of Medium:
Online Resource
ISSN:
0034-6748
,
1089-7623
Language:
English
Publisher:
AIP Publishing
Publication Date:
2007
detail.hit.zdb_id:
209865-9
detail.hit.zdb_id:
1472905-2
SSG:
11
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