ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The calculation of Miller indices from out-of-plane angle measurements with scanning force microscopy (SFM) is demonstrated on three different systems: rutile on haematite, rutile on sapphire and haematite on sapphire. The height of the investigated crystallites ranges from several millimetres (rutile on haematite) down to 〈10 nm (haematite on sapphire). General issues of goniometry by means of SFM, such as the influence of the scanner calibration, the adjustment of the feedback loop on the error involved in out-of-plane angle measurements and the limitation of SFM goniometry due to tip geometry, are discussed and a comparison with other methods are given.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740230613
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