ISSN:
1572-817X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract New optoelectronic techniques for measuring semiconductor laser turn-on delay times and jitter with a picosecond temporal resolution are proposed and were employed for both conventional, homogeneous cavity and ion-bombarded picosecond diode laser characterization. Distinct differences in the characteristics of those lasers were found.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00620314
Permalink