In:
MRS Proceedings, Springer Science and Business Media LLC, Vol. 591 ( 1999)
Abstract:
A combination of two nondestructive techniques, Grazing Incidence X-ray Reflectivity and High Resolution X-ray Diffraction, is used to study (at around 10Å resolution) the composition profile across a 500Å thick film of BaTiO 3 grown epitaxially on (100) MgO by MOCVD. Results from both studies indicate diffusion of Mg to about 250Å into the film at film-substrate interface, consistent with the diffuse ferroelectric phase transition observed in this film. The lattice parameter a shows a progressive decrease as we move into the film from the interface, and an anomalously low value in the Mg-free portion of the film.
Type of Medium:
Online Resource
ISSN:
0272-9172
,
1946-4274
Language:
English
Publisher:
Springer Science and Business Media LLC
Publication Date:
1999
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