In:
Proceedings, annual meeting, Electron Microscopy Society of America, Cambridge University Press (CUP), Vol. 42 ( 1984-08), p. 562-563
Abstract:
Using a TEM equipped with an electron energy loss spectrometer (EELS) the plasmon energy, E p of a material can easily be determined for specimens of thickness up to a few thousand Å. This coincides with the film thicknesses encountered in thin film technology, e.g., amorphous solar cells. E p is to the first approximation proportional to the square root of the valence electron density, and is thus sensitive to the chemical composition and the density of a material. E p measurements using EELS have therefore the potential of being a convenient way of characterizing a material, as has been demonstrated for hydrogenated metals, and this could be particularly useful for amorphous materials where characterization techniques such as x-ray and electron diffraction are of limited value.
Type of Medium:
Online Resource
ISSN:
0424-8201
,
2690-1315
DOI:
10.1017/S0424820100112749
Language:
English
Publisher:
Cambridge University Press (CUP)
Publication Date:
1984
SSG:
11
Permalink
