In:
Journal of Applied Crystallography, International Union of Crystallography (IUCr), Vol. 53, No. 4 ( 2020-08-01), p. 949-956
Abstract:
The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resolution complex-valued wavefunctions of individual pulses without strong constraints on the illumination or sample object used. The technique is demonstrated within experimental conditions suited for diffraction experiments and exploiting Kirkpatrick–Baez focusing optics. This lensless technique, applicable to many other short-pulse instruments, can achieve diffraction-limited resolution.
Type of Medium:
Online Resource
ISSN:
1600-5767
DOI:
10.1107/S1600576720006913
DOI:
10.1107/S1600576720006913/zy5004sup1.mp4
Language:
Unknown
Publisher:
International Union of Crystallography (IUCr)
Publication Date:
2020
detail.hit.zdb_id:
2020879-0
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