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  • Berhan, M.N.  (5)
  • Rusop Mahmood, Mohamad  (5)
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  • 1
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2012
    In:  Advanced Materials Research Vol. 576 ( 2012-10), p. 602-606
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 576 ( 2012-10), p. 602-606
    Abstract: Zinc Oxide (ZnO) films were prepared on unheated glass substrate by radio frequency (RF) magnetron sputtering technique and post deposition annealing of the ZnO thin film were performed at 350, 400, 450 and 500°C. Post annealing temperature was found to improve the structural and electrical characteristics of the deposited films. The structural properties of the films were carried out by the surface profiler, X-Ray diffraction (XRD), atomic force microscopy (AFM) and field emission scanning electron microscope (FESEM) while the electrical properties were measured using current voltage (I-V) probe measurement system. All samples exhibit the (002) peak and the sample annealed at 500°C gives the highest crystalline quality, highest Rms roughness (1.819 nm) and highest electrical conductivity (3.28 x 10-3 Sm-1).
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2012
    detail.hit.zdb_id: 2265002-7
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  • 2
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 272-276
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 272-276
    Abstract: The optical properties and morphology of Aluminum (Al) doped Zinc Oxide (ZnO) thin films prepared by sol-gel method have been investigated. The thin films were prepared at annealing temperature of 550 OC and have been exposed under wet and dry conditions. UV-Vissmeasurements have been carried out to investigate the optical properties while Scanning Electron Microscope (SEM) to investigate morphology. The grain size of films was increased with increased annealing temperature. The average optical transmittance became about 80% in the visible and had sharp ultraviolet absorption edges at 380 nm. The absorption edge analysis revealed that the optical band gap energy for the films was ~ 3.26 eV. The surface morphology in increasing annealing temperature has a big size and less porosity between particles.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
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  • 3
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 367-370
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 367-370
    Abstract: Zinc Oxide thin film has been prepared by sol-gel spin-coating techniques and has three steps preparation were includes. They were solution preparation, thin film deposition and characterization process. The film were prepared to investigate the annealing temperatures depend with two environments were hot and room temperatures. Annealing temperatures were set up into five temperatures 200°C, 300°C, 400°C, 500°C, and 600°C were heated inside furnace. The characterization of ZnO thin film was measured by UV-Vis Spectrometry which to measure the transmittance of ZnO have when through the medium. The transmittance was investigated by use glass as a substrate. The optical properties showed when increased annealing temperatures, so the high UV was transmit. From that, the absorption coefficient of ZnO also can also investigate too. The surface morphology in increasing annealing temperature has a small size and less porosity between particles.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
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  • 4
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 333-337
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 333-337
    Abstract: Zinc Oxide (ZnO) thin films were deposited on thermally oxidized SiO2 by varying the oxygen flow rate. The deposition process were done using radio frequency (RF) magnetron sputtering at various oxygen flow rate ranging from 0 to 40 sccm. The surface morphology and crystallinity were analyzed by field emission scanning electron microscopy (FESEM) and X-Ray Diffractometer (XRD) respectively. The average thickness and deposition rate decreases with an increase of oxygen content. The grain size was measured by FESEM and it was found that it is also decreasing with the increased of oxygen flow rate. The films grown with 10 sccm oxygen shows the highest (002) peak however it is expected that the sample deposited with 40 sccm oxygen exhibit the highest sensitivity toward NH3 gas due to the highest surface to volume ratio.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
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  • 5
    Online Resource
    Online Resource
    Trans Tech Publications, Ltd. ; 2013
    In:  Advanced Materials Research Vol. 667 ( 2013-3), p. 549-552
    In: Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 549-552
    Abstract: The properties of zinc oxide thin films were prepared by sol-gel spin-coating method have been presented. This study based on optical and electrical properties of ZnO thin film. The effects of annealing temperatures that exposed with two environments properties have been investigated. Environments exposed in room (27°C) and hot (80°C) temperatures which are stored by various days. Solution preparation, thin film deposition and characterization process were involved in this project. The ZnO films were characterized using UV-Vis-NIR spectrophotometer for optical properties. From that equipment, the percentage of transmittance (%) and absorption coefficient spectra were obtained. With two environments showed have different absorption coefficient are reveal and all films have low absorbance in visible and near infrared (IR) region but have high UV absorption properties. From SEM investigations the surface morphology of ZnO thin film shows the particles size become smaller and denser in hot temperatures while in room temperatures have porosity between particles.
    Type of Medium: Online Resource
    ISSN: 1662-8985
    URL: Issue
    Language: Unknown
    Publisher: Trans Tech Publications, Ltd.
    Publication Date: 2013
    detail.hit.zdb_id: 2265002-7
    Location Call Number Limitation Availability
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