In:
Advanced Materials Research, Trans Tech Publications, Ltd., Vol. 667 ( 2013-3), p. 287-293
Abstract:
The improvement of sensitivity toward humidity by insertion of buffer layer has been investigated. The insertion of hetero- or homo-buffer layer of zinc oxide (ZnO) thin film before deposition of high quality ZnO had been reported for the growth on highly mismatched substrate. Three samples are characterized with different properties which are as deposited ZnO thin film without buffer layer (as deposited ZnO thin film) , anneal ZnO thin film without buffer layer (ZnO thin film) and anneal ZnO thin film with buffer layer (ZnO/ AZO thin film). The structural properties of ZnO thin film has been characterized field emission scanning electron microscopy (FESEM) JEOL JSM 6701F, atomic force microscope AFM (Park System XE-100) and XRD (Rigaku Ultima IV). The electrical and optical properties has been characterized using 2 point probe I-V measurement (Keithley 2400) and UV-Vis spectrophotometer (JASCO 670) respectively. In this work, we have focused on investigating the humidity sensitivity of ZnO thin film deposited using RF magnetron sputtering (SNTEK RSP 5004-PVD) with and without the buffer layer (Aluminum-doped ZnO (AZO)) for humidity sensor application.
Type of Medium:
Online Resource
ISSN:
1662-8985
DOI:
10.4028/www.scientific.net/AMR.667
DOI:
10.4028/www.scientific.net/AMR.667.287
Language:
Unknown
Publisher:
Trans Tech Publications, Ltd.
Publication Date:
2013
detail.hit.zdb_id:
2265002-7
Permalink
